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    Web Store / Products / FESPAW-V2
    FESPAW-V2 - Systems for Research

    FESPAW-V2

    FESPAW-V2

    Price On Request - CONTACT US FOR QUOTE
    2.8N/m, 75kHz, 4 Sided Tip, Al Reflex Coating, Wafer

    • A wafer of High quality etched silicon probes for soft TappingMode™ imaging and force modulation in air.

      Unmounted for use on standard AFM's.

      Bruker AFM Probes has introduced an improved version of its popular, FESP/FESPA AFM probes. Bruker’s new line of FESP high quality premium etched silicon probes set the industry standard for soft TappingMode imaging and force modulation in air.

      The new design provides:

      • Tighter dimensional specifications for improved probe to probe consistency
      • Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
      • Improved probe quality and aesthetics

      This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model FESPW-V2.


    • Tip Geometry: Standard (Steep)
      Tip Height: 10 - 15
      Front Angle: 25 ± 2.5
      Back Angle: 15 ± 2.5
      Side Angle: 22.5 ± 2.5
      Tip Radius (Nom): 8
      Tip Radius (Max): 12
      Tip Set Back (Nom): 15
      Tip Set Back( RNG): 5 - 25
    • The Aluminum reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers (< 2.5 µm), highly reflective samples, and machine vision applications.

      Cantilever Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
      Cantilever Thickness (Nom): 2.75
      Cantilever Thickness (RNG): 2.0 - 3.5
      Cantilever Geometry: Rectangular
      Cantilevers Number: 1
      Back Side Coating: Reflective Aluminum