Select Quantity
Electrical, Tapping Mode AFM Probe

  • Electrical, Tapping Mode AFM Probe

    Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation, and electric modes such as:

    • scanning capacitance microscopy (SCM)
    • electrostatic force microscopy (EFM)
    • Kelvin probe force microscopy (KFM)
    • scanning probe lithography

    The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

    The AFM holder chip fits most commercial AFM systems as it is industry standard size.

  • AFM Tip

    SHAPE Rotated
    Tip Height 17µm
    From 15µm To 19µm
    Tip Setback 15µm
    From 10µm To 20µm
    Tip Radius < 25nm
    Half Cone Angle 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex
  • AFM Cantilever

    Shape Beam
    Force Constant 40N/m - From 20N/m To 75N/m
    Resonance Frequency 300kHz - From 200kHz To 400kHz
    Length 125µm - From 115µm To 135µm
    Width 30µm - From 25µm To 35µm
    Thickness 4µm - From 3µm To 5µm