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    Web Store / Products / ElectriAll-In-One
    ElectriAll-In-One - Systems for Research
    ElectriAll-In-One - Systems for Research
    ElectriAll-In-One - Systems for Research
    ElectriAll-In-One - Systems for Research
    ElectriAll-In-One - Systems for Research
    ElectriAll-In-One - Systems for Research
    ElectriAll-In-One - Systems for Research
    ElectriAll-In-One - Systems for Research

    AIOE-10

    ElectriAll-In-One

    $428.20
    Select Quantity
    Electrical AFM Probe with 4 Different Cantilevers

    • Electrical AFM Probe with 4 Different Cantilevers

      Versatile monolithic silicon AFM probe with 4 different platinum coated cantilevers on a single AFM holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping / non-contact mode and electric modes such as:

      • scanning capacitance microscopy (SCM)
      • electrostatic force microscopy (EFM)
      • Kelvin probe force microscopy (KFM)
      • scanning probe lithography

      The rotated tips allow for more symmetric representation of high sample features. The consistent tip radii ensure good resolution and reproducibility.

      The AFM holder chip fits most commercial AFM systems as it is industry standard size.

      The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose in the very last moment the right cantilever for each application. You dont need to stock various AFM Probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the ElectriAll-In-One cantilevers differs from the geometry of comparable specialized single-cantilever AFM probes.



    • AFM Tip

      SHAPE Rotated
      Tip Height 17µm
      From 15µm To 19µm
      Tip Setback 15µm
      From 10µm To 20µm
      Tip Radius < 25nm
      Half Cone Angle 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex
    • Cantilever A - Contact Mode Cantilever B - Force Modulation
      Shape Beam Shape Beam
      Force Constant 0.2N/m - From 0.04N/m To 0.7N/m Force Constant 2.7N/m - From 0.4N/m To 10N/m
      Resonance Frequency 15kHz - From 10kHz To 20kHz Resonance Frequency 80kHz - From 50kHz To 110kHz
      Length 500µm - From 490µm To 510µm Length 210µm - From 200µm To 220µm
      Width 30µm - From 25µm To 35µm Width 30µm - From 25µm To 35µm
      Thickness 2.7µm - From 1.7µm To 3.7µm Thickness 2.7µm - From 1.7µm To 3.7µm
      Cantilever C - Soft Tapping Cantilever D - Tapping Mode
      Shape Beam Shape Beam
      Force Constant 7.4N/m - From 1N/m To 29N/m Force Constant 40N/m - From 7N/m To 160N/m
      Resonance Frequency 150kHz - From 70kHz To 230kHz Resonance Frequency 350kHz - From 200kHz To 500kHz
      Length 150µm - From 140µm To 160µm Length 100µm - From 90µm To 110µm
      Width 30µm - From 25µm To 35µm Width 50µm - From 45µm To 55µm
      Thickness 2.7µm - From 1.7µm To 3.7µm Thickness 2.7µm - From 1.7µm To 3.7µm