SEM Pin Mount Specimen Holders
for Scanning Electron Microscopy
A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1/8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).
Used on FEI/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs
Holds two standard geological thin sections or petrographic slides of up to 47 x 27mm (compatible with 45 x 25mm, 46 x 26mm, 46 x 27mm, and 47 x 27mm). Tweezer inserts enable easy loading. Clips are provided for secure holding. Overall dimensions are 55 x 58 x 8mm. Pin length is 9.5mm. Material: aluminum with copper clips and brass screws.
Screw used is M2 x 3mm, Pan, Brass
Dual Geological Thin Section Holder, 3.2mm (1/8") Pin