• Bruker’s new series of conductive diamond coated probes provide consistent performance with high wear resistance in mechanical and electrical applications. In mechanical applications, these probes provide extreme wear resistance. On a Bruker Dimension Icon with FASTForce Volume Contact Resonance, these probes provide consistent results over many dozens of images.

    In electrical applications, these probes provide high performance in Scanning Spreading Resistance Microscopy (SSRM) and Piezoresponse Force Microscopy (PFM) to characterize advanced semiconductor devices, Microelectromechanical Systems (MEMS), and biosensors providing the prolonged tip lifetime in combination with boosted conductivity.

    The DDLTESP-V2 probe provides:

    • High performance contact resonance imaging with Dimension Icon
    • High electrical performance due to its consistent tip shape
    • Sensitive nanoelectrical measurements with highly conductive coating
    • High resolution electrical imaging with a sharp conductive tip
    • High quality probe manufactured by Bruker AFM Probes
    • High spring constant for contact resonance on hardest materials such s ceramics
    • Other applications of this probe include: Scanning Capacitance Microscopy (SCM), conductivity measurements (C-AFM and PeakForce TUNA), and other electrical characterization applications.

  • Tip Geometry: Standard
    Tip Height: 10 - 15
    Front Angle: 25+/-2
    Back Angle: 15+/-2
    Side Angle: 17.5+/-2
    Tip Radius (Nom): 100
    Tip Radius (Max): 150
    Tip Coating: Conductive Diamond
    Tip Set Back (Nom): 9.5
    Tip Set Back( RNG): 7 - 12

  • Cantilever Thickness (Nom): 7
    Cantilever Thickness (RNG): 6 - 8
    Cantilever Geometry: Rectangular
    Cantilevers Number: 11 - 31
    Front Side Coating: Conductive Diamond
    Back Side Coating: Reflective Aluminum