Cross-Sectional Holder

  • SEM Pin Mount Specimen Holders
    for Scanning Electron Microscopy

    A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1/8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).
    Used on FEI/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs

    3.2mm pin (1/8") and flat point to allow easy angle changes. Insert specimens edge-on and observe the break directly. Accommodates sample thickness up to 6.35mm (1/4"). Non-magnetic stainless steel. Overall height is 30mm (1.2") from the pivot point. The clamping part is a 16mm (0.62") cube w/o thumb screws.

    Screw used is 4-40 x 1/2 Thumb