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Gold Coated Contact Mode AFM Probe

  • Gold Coated Contact Mode AFM Probe

    Monolithic silicon AFM probe for contact mode and lateral force mode operation.

    The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

    The AFM holder chip fits most commercial AFM systems as it is industry standard size.

    Not recommended for electric applications on abrasive sample surfaces!

  • AFM Tip

    SHAPE Rotated
    Tip Height 17µm
    From 15µm To 19µm
    Tip Setback 15µm
    From 10µm To 20µm
    Tip Radius < 25nm
    Half Cone Angle 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex
  • AFM Cantilever

    Shape Beam
    Force Constant 0.2N/m - From 0.07N/m To 0.4N/m
    Resonance Frequency 13kHz - From 9kHz To 17kHz
    Length 450µm - From 440µm To 460µm
    Width 50µm - From 45µm To 55µm
    Thickness 2µm - From 1µm To 3µm