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    Web Store / Products / PR-UM-CnIR-B-10
    Bruker Contact mode probes for AFM-IR Type B - Unmounted - Systems for Research
    Bruker Contact mode probes for AFM-IR Type B - Unmounted - Systems for Research
    Bruker Contact mode probes for AFM-IR Type B - Unmounted - Systems for Research
    Bruker Contact mode probes for AFM-IR Type B - Unmounted - Systems for Research

    PR-UM-CnIR-B-10

    PR-UM-CnIR-B-10

    $855.50

    • Bruker Contact mode probes for AFM-IR Type B - Unmounted

      A 10 pack of probes for contact mode imaging and nanoIR spectroscopic measurements. Unmounted for use on Bruker’s IconIR system or others systems that can take a standard cantilever chip.

      This contact mode probe has a full wrap gold coating, on the reflex side — for increased feedback laser signal, on the tip side — to enable nanoIR measurements.


    • General Specifications

      Feature Value
      Geometry Rectangular
      Tip Radius (nm) Nominal: 20.0, Max: 35.0
      Frequency (kHz) Nominal: 13, Min: 10, Max: 16
      Length (µm) Nominal: 450, Min: 430, Max: 470
      Spring Constant (N/m) Nominal: 0.2, Min: 0.1, Max: 0.4
      Width (µm) Nominal: 50, Min: 45, Max: 55

      Tip Specifications

      Feature Value
      Tip Height (µm) 12.5 ± 2.5
      Front Angle (º) 25.0
      Back Angle (º) 15.0
      Side Angle (º) 22.5
      Coating Au (Gold) on tip side

      Cantilever Specifications

      Feature Value
      Material Antimony (n) doped Si (0.010–0.025 Ohm·cm)
      Thickness (µm) 2.0
      Coating Au (Gold) 50 nm on reflex side
      Number of Cantilevers 1