Nanomechanics Probe, 150 N/m, 500 kHz, 10 nm ROC, 5-Pack

  • Nanomechanics Probe, 150 N/m, 500 kHz, 10 nm ROC, 5-Pack
    Out of stock. 
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    These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear-resistant diamond and a broad cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes have demonstrated highly repeatable deep (~100nm) indentations into materials such as fused silica and can image the indents at high resolution in-situ using the same probe. Each cantilever comes individually characterized with both spring constant and tip radius accurately measured, to enable fully quantitative nanomechanical measurements. Each probe comes with a high-resolution SEM image showing the precise tip shape to enable fully quantitative measurements. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam.

    Nanomechanical modes: Topography, nanoscratching, and nanoindentation, and their combination with PeakForce QNM, FASTForce Volume, or contact resonance.

  • Cone ½ angle = 45 ± 3°

    Tip Geometry: Cone
    Tip Height: 12.5 ± 2.5
    Tip Radius (Nom): 10 ± 5
    Tip Coating: Highly conductive single crystal diamond
    Tilt Compensation: 1

  • Back Side Coating: Reflective Au