Kit contains two test specimens: one with synthetic GSR particles and one with synthetic particles for automated particle analyses using SEM/EDX.
This Synthetic Particle Specimen (SPS) has been specifically designed for the adjustment and validation of analytical SEM/EDX systems used for automated analysis of GSR samples. It is especially useful for quick system validation checks and quality assurance procedures.
The SPS-TM-A test specimen is manufactured on a glassy carbon substrate with a size of 8 x 8mm with various sizes of synthetic particles containing Pb, Sb and Ba. The synthetic GSR particles with a size varying from 0.5 to 2.0µm are statistically distributed in an area of 6 x 6mm. For improved conductivity, the SPS test specimen has been coated with a thin layer of carbon. The SPS test specimens are made with a defined number of Pb/Sb/Ba particles. However, some particles can be missing or could have been on a different location. Therefore, each SPS test specimen has been individually tested and comes with a certificate stating the exact number of Pb/Sb/Ba particles and their locations.
It is recommended that the BSE signal of the SEM is used for imaging the particles since this a high contrast signal difference between the Pb/Ba/Sb particles and the glassy carbon substrate. Beam current of the SEM should not exceed 2 nA. Instructions are supplied with the SPS test specimen. For the evaluation of the automated GSR measurements it is recommend that the data obtained from the Pb/Ba/Sb particles (in particular their X-Y coordinates and the particle size) is displayed as an X-Y plot. When using an appropriate display area, a direct comparison can be made of the positions and the size of the detected particles with the particle matrix.
This test specimen has 15 lines of particles with different sizes with 20 particles spaced equally per line. With the known particle sizes and positions this test specimen can be used to test and validate SEM/EDX systems used for automated particle analysis applications.
Short test sample description:
This test specimen is particularly useful for calibration of fields/SEM stage, particle measurements/classification, EDX analysis and to correct to overlap, gaps and rotation of the fields. It is also useful for aligning the scan rotation with the X/Y movements of the SEM stage.
To avoid contamination, we recommend storing the SPS-TM-A GSR test specimen in the PELCO® SEM Sample Stub Vacuum Desiccator #16179