TEM 4 Grid Holder for SEM

SEM Pin Mount Specimen Holders
for Scanning Electron Microscopy

A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1/8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).
Used on FEI/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs

TEM 4 Grid Holder for SEM
This low profile TEM grid holder holds up to 4 TEM grids. Thin copper spring clips hold the grids in place, providing a wider viewing angle suitable for both imaging and spectroscopy of samples on grids in SEM. It is often beneficial for films or small particle samples to be placed on a TEM grid with a support film. This can significantly decrease the background in an EDS spectrum, and improve the detection limit. The holder has a short 6mm pin. It is 25.3mm (0.996") in diameter with an overall height, not including the pin, of approximately 3.8mm (0.15").