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    Web Store / Probes / DDESP-V2
    DDESP-V2 - Systems for Research

    DDESP-V2

    DDESP-V2

    $1,960.00
    80 N/m, 450 kHz, Conductive Doped Diamond Coating

    • Bruker DDESP-V2 Electrical Probes

      ***Note: Bruker's new DDESP-V2 probe replaces the legacy DDESP-10 probe.Bruker recommends transitioning to this probe. The legacy DDESP-10 is no longer available for ordering.

      Providing consistent performance and high sensitivity.

      Bruker's new conductive diamond coated probe provides high performance Scanning Spreading Resistance Microscopy (SSRM)and Piezoresponse Force Microscopy (PFM) to characterize advanced semiconductor devices, Microelectromechanical Systems (MEMS), and biosensors providing the prolonged tip lifetime in combination with boosted conductivity.

      The DDESP-V2 probe provides:

      • High electrical performance due to its consistent tip shape
      • Sensitive nanoelectrical measurements with highly conductive coating
      • High resolution electrical imaging with a sharp conductive tip
      • High quality probe manufactured by Bruker AFM Probes

      Other applications of the DDESP-V2 probe include: Scanning Capacitance Microscopy (SCM), conductivity measurements (C-AFMand PeakForce TUNA), and other electrical characterization applications.

      For the highest resolution SSRM measurements, Bruker also offers solid diamond probes with pyramidal tips; please see model SSRM-DIA.

      For non-electrical applications where wear resistance is required, the diamond-like carbon (DLC) coated probes, Model TESPD provide a cost effective alternative.

      Bruker Atomic Force Microscopy group also provides many other nano-electrical probes and modes for AFM based electrical measurements including our unique PeakForce KPFM and PeakForce TUNA modes.

    • The doped diamond coating is used to harden the tip in applications that require both increased wear resistance and a conductive tip. The tradeoff for the increased lifetime is that the coating also increases the diameter of the tip. If a conductive coating is not needed, the DLC coated probes (Model# TESPD) provide a cost effective alternative.

      Tip Geometry: Standard (Steep)
      Tip Height: 10 - 15
      Front Angle: 25 ± 2.5
      Back Angle: 17.5 ± 2.5
      Side Angle: 20 ± 2.5
      Tip Radius (Nom): 100
      Tip Radius (Max): 150
      Tip Coating: Conductive Diamond
      Tip Set Back (Nom): 14
      Tip Set Back( RNG): 11 - 16
    • The Aluminum reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers (< 2.5 µm), highly reflective samples, and machine vision applications.

      Cantilever Material: 0.010-0.025 Ωcm Antimony (n) doped Si
      Cantilever Thickness (Nom): 3.6
      Cantilever Thickness (RNG): 2.85 - 4.35
      Cantilever Geometry: Rectangular
      Cantilevers Number: 1
      Front Side Coating: Conductive Diamond
      Back Side Coating: Reflective Aluminum