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    Web Store / BudgetSensors AFM Probes / MagneticMulti75-G
    MagneticMulti75-G - Systems for Research
    MagneticMulti75-G - Systems for Research
    MagneticMulti75-G - Systems for Research
    MagneticMulti75-G - Systems for Research

    Multi75M-G-10

    MagneticMulti75-G

    $370.60
    Select Quantity
    Hard Magnetic, Medium Momentum AFM Probe

    • Hard Magnetic, Medium Momentum AFM Probe

      Monolithic silicon AFM probe for magnetic force microscopy (MFM). The cobalt alloy coated tip has a magnetic moment of roughly 10^-13 emu and coercivity of roughly 300 Oe.

      The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

      The AFM holder chip fits most commercial AFM systems as it is industry standard size.




    • AFM Tip

      SHAPE Rotated
      Tip Height 17µm - From 15µm To 19µm
      Tip Setback 15µm - From 10µm To 20µm
      Tip Radius < 60nm
      Half Cone Angle 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

    • AFM Cantilever

      Shape Beam
      Force Constant 3N/m - From 1N/m To 7N/m
      Resonance Frequency 75kHz - From 60kHz To 90kHz
      Length 225µm - From 215µm To 235µm
      Width 28µm - From 23µm To 33µm
      Thickness 3µm - From 2µm To 4µm