Select Quantity
Electrical, Force Modulation AFM Probe

  • Electrical, Force Modulation AFM Probe

    Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM), and electric modes such as:

    • scanning capacitance microscopy (SCM)
    • electrostatic force microscopy (EFM)
    • Kelvin probe force microscopy (KFM)
    • scanning probe lithography

    The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

    The AFM holder chip fits most commercial AFM systems as it is industry standard size.

  • AFM Tip

    SHAPE Rotated
    Tip Height 17µm
    From 15µm To 19µm
    Tip Setback 15µm
    From 10µm To 20µm
    Tip Radius < 25nm
    Half Cone Angle 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex
  • AFM Cantilever

    Shape Beam
    Force Constant 3N/m - From 1N/m To 7N/m
    Resonance Frequency 75kHz - From 60kHz To 90kHz
    Length 225µm - From 215µm To 235µm
    Width 50µm - From 45µm To 55µm
    Thickness 3µm - From 2µm To 4µm