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PR-EX-AN2-200-5
The AN-2 probes are designed for nano-TA and HT-AFM. For SThM mode, the GLA-1 probes are required. The AN-2 probes are available in two lengths:
200 µm: Optimized for tapping or AC mode.
300 µm: More suitable for contact mode.
These probes come pre-mounted to larger mounts for easier handling and reliable electrical connection. They are sold in packs of 5.
| Feature | Value |
|---|---|
| Geometry | Rectangular |
| Tip Radius (nm) | Nominal: 15.0, Max: 30.0 |
| Frequency (kHz) | Nominal: 78, Min: 55, Max: 100 |
| Length (µm) | Nominal: 195, Min: 185, Max: 205 |
| Spring Constant (N/m) | Nominal: 2.5, Min: 0.7, Max: 4.6 |
| Width (µm) | Nominal: 15, Min: 13, Max: 16 |
| Feature | Value |
|---|---|
| Material | Single Crystal Si |
| Tip Height (µm) | 5 |
| Front Angle (º) | 17.5 ± 2.5 |
| Back Angle (º) | 25.0 ± 2.5 |
| Side Angle (º) | 20.0 ± 2.5 |
| Feature | Value |
|---|---|
| Material | Single Crystal Si |
| Geometry | Rectangular |
| Number of Cantilevers | 1 |
| Thickness (µm) | Nominal: 2.2, Range: 1.8 – 2.6 |
| Back Side Coating | Optional Reflective |