Probes for Conductive AFM

5 pack of contact mode probes compatible with the nanoIR2/2s/2FS, nanoIR, and afm+ for CAFM measurements and contact mode imaging.
Microfabricated silicon probes that are ~450 microns long and are coated with ~25 nm of PtIr conductive coating on both sides of the cantilever.
Premounted on half washer mounts with a two pin connector for easy exchange and electrical connection to the CAFM module.
Requires the CAFM module.