PFDT750

$2,087.40

High aspect ratio probe for repeatable, accurate depth metrology and imaging on challenging structures such as deep trenches and pits, as encountered on semiconductor samples and optics.
Designed for PeakForce Tapping operation on Dimension Icon.
750nm tall spike with 10nm end radius and 65nm base width
Tip Geometry: Rotated (Symmetric)

Tip Height: 3 - 8

Front Angle: 15+/-2

Back Angle: 25+/-2

Side Angle: 17.5+/-2

Tip Radius (Nom): 10

Tip Coating: None

Tilt Compensation: 12
Cantilever Thickness (Nom): 0.5

Cantilever Thickness (RNG): 0.47-0.53

Cantilever Geometry: Special

Cantilevers Number: 1

Back Side Coating: Reflective Aluminum