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    Web Store / Products / PFDT2500
    PFDT2500 - Systems for Research

    PFDT2500

    PFDT2500

    $2,236.50
    High aspect ratio probe for repeatable, accurate depth metrology and imaging on challenging structures such as deep trenches and pits, as encountered on semiconductor samples and optics.
    Designed for PeakForce Tapping operation on Dimension Icon.
    2500nm tall spike with 30nm end radius and 150nm base width.

    • High aspect ratio probe for repeatable, accurate depth metrology and imaging on challenging structures such as deep trenches and pits, as encountered on semiconductor samples and optics.
      Designed for PeakForce Tapping operation on Dimension Icon.
      2500nm tall spike with 30nm end radius and 150nm base width

    • Tip Geometry: Rotated (Symmetric)
      Tip Height: 3 - 8
      Front Angle: 15+/-2
      Back Angle: 25+/-2
      Side Angle: 17.5+/-2
      Tip Radius (Nom): 30
      Tip Coating: None
      Tilt Compensation: 12

    • Cantilever Thickness (Nom): 500
      Cantilever Thickness (RNG): 470-530
      Cantilever Geometry: Special
      Cantilevers Number: 1
      Back Side Coating: Reflective Aluminum