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16430
SEM Pin Mount Specimen Holders
for Scanning Electron Microscopy
A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1/8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).
Used on FEI/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs
The PELCO® Universal SEM Sample Holder Set extends the capabilities of your SEM by offering convenient sample holders for larger or awkwardly shaped samples, multiple samples, cross sections or pre-tilt imaging. This versatile specimen holder set can be used on most SEM brands since it includes pin mount adapters for FEI/Philips, Zeiss/LEO/Leica, Tescan. A 12.2mm stub adapter for JEOL is also included and the holders have M4 thread which is compatible with Hitachi SEMs. The set is comes in plastic styrene box with a convenient plastic sample holder tray to keep the sample holders dust free and ready to use.
The favorably priced PELCO® Universal SEM Sample Holder Set contains the following sample holders/components:
PELCO® Technical Notes, PELCO® Universal SEM Sample Holder Set, PDF file
PELCO® Universal SEM Sample Holder Set