NC-LC
High wear resistant diamond cone probe with high probe-to-probe consistency in tip shape and a tip-radius of 20nm. Ideally suited to long lifetime imaging on low relief samples at moderately high resolution. Conductive with a contact resistance in the 100kOhm range. Intermediate spring constant of 8N/m. For even higher resolution consider the AD series of diamond probes. 
Applications include
| Tip Geometry: | Standard | 
| Tip Height: | 12.5 +/- 2.5 | 
| Front Angle: | 25+/-5 | 
| Back Angle: | 15+/-5 | 
| Side Angle: | 22.5+/-5 | 
| Tip Radius (Nom): | 20 | 
| Tip Coating: | Highly conductive single cystal diamond | 
| Tip Set Back (Nom): | 15-25 | 
| Tilt Compensation: | 1 +/- 1 | 
| Cantilever Material: | Diamond cone probe, 100N/m | 
| Cantilever Thickness (Nom): | 4 | 
| Cantilever Thickness (RNG): | 3.5-4.5 | 
| Cantilever Geometry: | Rectangular | 
| Cantilevers Number: | 1 | 
| Back Side Coating: | Reflective Au |