MLNV

MLNV

Value Line Silicon Nitride probe for contact mode imaging and force measurements on soft samples.
10-Pack

  • Value Line Silicon Nitride probe for contact mode imaging and force measurements on soft samples. 6 silicon nitride cantilevers provide spring constants down to 0.01 N/m.

    • 0.01 to 0.6 N/m, 20nm tip radius, gold reflex coating

    • 10 probes per pack

    • Compatible with most commercial AFMs

     Geometry: 
    A Triangle
    Tip Radius (nm):
    Nom: 20
    Max: 70
    Frequency (KHz):
    Nom: 22
    Min: 12
    Max: 32
    Length (µm):
    Nom: 175
    Min: 170
    Max: 180
    Spring Const (N/m):
    Nom: 0.07
    Min: 0.02
    Max: 0.15
    Width (µm):
    Nom: 22
    Min: 17
    Max: 27





  • Tip Height: 2.5 - 8 µm
    Front Angle: 15 ± 2.5º
    Back Angle: 25 ± 2.5º
    Side Angle: 17.5 ± 2.5º

  • Cantilever Material: Silicon Nitride
    Geometry: Rectangular & Triangular
    Cantilever Thickness (Nom): 0.55µm
    Cantilever Thickness (RNG): 0.5 - 0.6µm
    Cantilevers Number: 6
    Back Side Coating: Reflective Gold