MESP-HM-V2
***Note: Bruker's new MESP-HM-V2 probe replaces the legacy MESP-HM probe. Bruker recommends transitioning to this probe. The legacy MESP-HM is still available for ordering while supplies last, at which point in will become obsolete.
Bruker's MESP-HM-V2 is the established choice for Magnetic Force Microscopy. Built on the high-performance RFESP-75 AFM probe, the hard Cobalt-Chromium coating on this tip is tailored for high-sensitivity and magnetic contrast. This cost-effective probe has a nominal tip radius of 80 nm for excellent lateral resolution for MFM, as well as other electrical and capacitance applications requiring a cantilever with conductive coating.
The MESP-HM-V2 has a nominal coercivity of 400 Oe (medium), and a magnetic moment of 3e-13 EMU (high).
The reflex side of the cantilever has a Co-Cr coating for increased reflectivity up to 2.5 times that of an uncoated probe.
The new design provides:
Tip Geometry: | Rotated |
Tip Height: | 10 - 15 |
Front Angle: | 17.5 ± 2.5 |
Back Angle: | 25 ± 2.5 |
Side Angle: | 20 ± 2.5 |
Tip Radius (Nom): | 80 |
Tip Radius (Max): | 100 |
Tip Coating: | Magnetic |
Tip Set Back (Nom): | 9.5 |
Tip Set Back( RNG): | 7 - 12 |
Cantilever Material: | 0.01 - 0.025 Ωcm Antimony (n) doped Si |
Cantilever Thickness (Nom): | 2.8 |
Cantilever Thickness (RNG): | 2.05 - 3.55 |
Cantilever Geometry: | Rectangular |
Cantilevers Number: | 1 |
Front Side Coating: | Magnetic CoCr |
Back Side Coating: | Reflective CoCr |