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    Web Store / Products / ESPW-V2
    ESPW-V2 - Systems for Research

    ESPW-V2

    ESPW-V2

    Price On Request - CONTACT US FOR QUOTE
    0.2N/m, 13kHz, 4 Sided Tip, No Reflex Coating, Wafer

    • A wafer High quality etched silicon probes for contact mode imaging in air.

      Unmounted for use on standard AFM's.

      Bruker AFM Probes has introduced an improved version of its popular, ESP/ESPA AFM probes. Bruker’s new line of ESP high quality premium etched silicon probes set the industry standard for contact mode in air.

      The new design provides:

      • Tighter dimensional specifications for improved probe to probe consistency
      • Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
      • Improved probe quality and aesthetics
      • This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model ESPAW-V2.

    • Tip Geometry: Standard (Steep)
      Tip Height: 10 - 15
      Front Angle: 25 ± 2.5
      Back Angle: 15 ± 2.5
      Side Angle: 22.5 ± 2.5
      Tip Radius (Nom): 8
      Tip Radius (Max): 12
      Tip Set Back (Nom): 15
      Tip Set Back( RNG): 5 - 25

    • Cantilever Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
      Cantilever Thickness (Nom): 2
      Cantilever Thickness (RNG): 1.25 - 2.75
      Cantilever Geometry: Rectangular
      Cantilevers Number: 1