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    Web Store / Products / ElectriTap300-G
    ElectriTap300-G - Systems for Research
    ElectriTap300-G - Systems for Research
    ElectriTap300-G - Systems for Research
    ElectriTap300-G - Systems for Research
    ElectriTap300-G - Systems for Research
    ElectriTap300-G - Systems for Research

    Tap300E-G-10

    ElectriTap300-G

    $428.20
    Select Quantity
    Electrical, Tapping Mode AFM Probe

    • Electrical, Tapping Mode AFM Probe

      Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation, and electric modes such as:

      • scanning capacitance microscopy (SCM)
      • electrostatic force microscopy (EFM)
      • Kelvin probe force microscopy (KFM)
      • scanning probe lithography

      The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

      The AFM holder chip fits most commercial AFM systems as it is industry standard size.




    • AFM Tip

      SHAPE Rotated
      Tip Height 17µm
      From 15µm To 19µm
      Tip Setback 15µm
      From 10µm To 20µm
      Tip Radius < 25nm
      Half Cone Angle 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

    • AFM Cantilever

      Shape Beam
      Force Constant 40N/m - From 20N/m To 75N/m
      Resonance Frequency 300kHz - From 200kHz To 400kHz
      Length 125µm - From 115µm To 135µm
      Width 30µm - From 25µm To 35µm
      Thickness 4µm - From 3µm To 5µm