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    Web Store / Products / ElectriCont-G
    ElectriCont-G - Systems for Research
    ElectriCont-G - Systems for Research
    ElectriCont-G - Systems for Research
    ElectriCont-G - Systems for Research
    ElectriCont-G - Systems for Research
    ElectriCont-G - Systems for Research

    ContE-G-10

    ElectriCont-G

    $370.60
    Select Quantity
    Electrical, Contact Mode AFM Probe

    • Electrical, Contact Mode AFM Probe

      Monolithic silicon AFM probe for contact mode and lateral force mode operation and electric modes such as:

      • scanning capacitance microscopy (SCM)
      • scanning probe lithography
      • The rotated tip allows for more symmetric representation of high sample features.

      The consistent tip radius ensures good resolution and reproducibility.

      The AFM holder chip fits most commercial AFM systems as it is industry standard size.


    • AFM Tip

      SHAPE Rotated
      Tip Height 17µm
      From 15µm To 19µm
      Tip Setback 15µm
      From 10µm To 20µm
      Tip Radius < 25nm
      Half Cone Angle 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

    • AFM Cantilever

      Shape Beam
      Force Constant 0.2N/m - From 0.07N/m To 0.4N/m
      Resonance Frequency 13kHz - From 9kHz To 17kHz
      Length 450µm - From 440µm To 460µm
      Width 50µm - From 45µm To 55µm
      Thickness 2µm - From 1µm To 3µm