A pack of 10 High quality etched silicon probes for soft TappingMode™ imaging and force modulation in air.
Unmounted for use on standard AFM's.
Bruker AFM Probes has introduced an improved version of its popular,FESP/FESPA AFM probes. Bruker’s new line of FESP high quality premiumetched silicon probes set the industry standard for soft TappingMode imaging and force modulation in air.
The new design provides:
This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model FESPA-V2.
|Tip Geometry:||Standard (Steep)|
|Tip Height:||10 - 15|
|Front Angle:||25 ± 2.5|
|Back Angle:||15 ± 2.5|
|Side Angle:||22.5 ± 2.5|
|Tip Radius (Nom):||8|
|Tip Radius (Max):||12|
|Tip Set Back (Nom):||15|
|Tip Set Back( RNG):||5 - 25|
|Cantilever Material:||0.01 - 0.025 Ωcm Antimony (n) doped Si|
|Cantilever Thickness (Nom):||2.75|
|Cantilever Thickness (RNG):||2.0 - 3.5|