0.2N/m, 13kHz, 4 Sided Tip, No Reflex Coating, Wafer

  • A wafer High quality etched silicon probes for contact mode imaging in air.

    Unmounted for use on standard AFM's.

    Bruker AFM Probes has introduced an improved version of its popular, ESP/ESPA AFM probes. Bruker’s new line of ESP high quality premium etched silicon probes set the industry standard for contact mode in air.

    The new design provides:

    • Tighter dimensional specifications for improved probe to probe consistency
    • Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
    • Improved probe quality and aesthetics
    • This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model ESPAW-V2.

  • Tip Geometry: Standard (Steep)
    Tip Height: 10 - 15
    Front Angle: 25 ± 2.5
    Back Angle: 15 ± 2.5
    Side Angle: 22.5 ± 2.5
    Tip Radius (Nom): 8
    Tip Radius (Max): 12
    Tip Set Back (Nom): 15
    Tip Set Back( RNG): 5 - 25

  • Cantilever Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
    Cantilever Thickness (Nom): 2
    Cantilever Thickness (RNG): 1.25 - 2.75
    Cantilever Geometry: Rectangular
    Cantilevers Number: 1