A wafer of High quality etched silicon probes for contact mode imaging in air.
Unmounted for use on standard AFM's.
Bruker AFM Probes has introduced an improved version of its popular, ESP/ESPA AFM probes. Bruker’s new line of ESP high quality premium etched silicon probes set the industry standard for contact mode in air.
The new design provides:
This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model ESPW-V2.
The current model ESPW is available for ordering through early 2015 at which point, it will become obsolete.
|Tip Geometry:||Standard (Steep)|
|Tip Height:||10 - 15|
|Front Angle:||25 ± 2.5|
|Back Angle:||15 ± 2.5|
|Side Angle:||22.5 ± 2.5|
|Tip Radius (Nom):||8|
|Tip Radius (Max):||12|
|Tip Set Back (Nom):||15|
|Tip Set Back( RNG):||5 - 25|
|Cantilever Material:||0.01 - 0.025 Ωcm Antimony (n) doped Si|
|Cantilever Thickness (Nom):||2|
|Cantilever Thickness (RNG):||1.25 - 2.75|
|Back Side Coating:||Reflective Aluminum|