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    Web Store / SEM Supplies

    SEM Supplies

    Thermo Scientific VolumeScope™ Pin Stub - Systems for Research
    Thermo Scientific VolumeScope™ Pin Stub - Systems for Research
    Thermo Scientific VolumeScope™ Pin Stub
    Thermo Scientific VolumeScope™ Pin Stub - Systems for Research
    Thermo Scientific VolumeScope™ Pin Stub - Systems for Research
    Thermo Scientific VolumeScope™ Pin Stub
    Thin Specimen Split Mount - Systems for Research
    Thin Specimen Split Mount - Systems for Research
    Thin Specimen Split Mount
    Thin Specimen Split Mount (AMRAY) - Systems for Research
    Thin Specimen Split Mount (AMRAY) - Systems for Research
    Thin Specimen Split Mount (AMRAY)
    Thin Specimen Split Mount Holder - Systems for Research
    Thin Specimen Split Mount Holder - Systems for Research
    Thin Specimen Split Mount Holder
    Thin Specimen Split Mount on Pin Stub - Systems for Research
    Thin Specimen Split Mount on Pin Stub - Systems for Research
    Thin Specimen Split Mount on Pin Stub
    Tilt specimen mount front - Systems for Research
    Tilt specimen mount front - Systems for Research
    Tilt Mount
    Tilt Mount, pin- Systems for Research
    Tilt Mount, pin- Systems for Research
    Tilt Mount, pin
    Tin on Carbon Disc, Medium Magnification - Systems for Research
    Tin on Carbon Disc, Medium Magnification - Systems for Research
    Tin on Carbon Disc, Medium Magnification
    Tin on Carbon Disc, Wide Magnification Range
    Tin on Carbon Disc, Wide Magnification Range
    Tin on Carbon Disc, Wide Magnification Range
    Tin on Carbon on Grid, High Magnification - Systems for Research
    Tin on Carbon on Grid, High Magnification - Systems for Research
    Tin on Carbon on Grid, High Magnification
    Tin Spheres on Carbon, Low Magnification - Systems for Research
    Tin Spheres on Carbon, Low Magnification - Systems for Research
    Tin Spheres on Carbon, Low Magnification
    Top Referencing Metallographic Mount Holder - Systems for Research
    Top Referencing Metallographic Mount Holder - Systems for Research
    Top Referencing Metallographic Mount Holder
    Triple 45° Cross Section Holder - Systems for Research
    Triple 45° Cross Section Holder - Systems for Research
    Triple 45° Cross Section Holder
    Triple 70° Cross Section Holder - Systems for Research
    Triple 70° Cross Section Holder - Systems for Research
    Triple 70° Cross Section Holder
    Triple 90° Cross Section Holder - Systems for Research
    Triple 90° Cross Section Holder - Systems for Research
    Triple 90° Cross Section Holder
    Triple Flat Sample Clip Holder - Systems for Research
    Triple Flat Sample Clip Holder - Systems for Research
    Triple Flat Sample Clip Holder
    Tube/Needle Clamp - Systems for Research
    Tube/Needle Clamp - Systems for Research
    Tube/Needle Clamp
    Tube/Needle Clamp - Systems for Research
    Tube/Needle Clamp - Systems for Research
    Tube/Needle Clamp
    Tweezer Style Mount Gripper for Grooved 25mm (1") dia. Pin Stub Mounts, 45° angle - Systems for Research
    Tweezer Style Mount Gripper for Grooved 25mm (1") dia. Pin Stub Mounts, 45° angle - Systems for Research
    Tweezer Style Mount Gripper for Grooved 25mm (1") dia. Pin Stub Mounts, 45° angle
    Tweezer Style Mount Gripper for Grooved 32mm (1.25") dia. Pin Stub Mounts, 45° angle - Systems for Research
    Tweezer Style Mount Gripper for Grooved 32mm (1.25") dia. Pin Stub Mounts, 45° angle - Systems for Research
    Tweezer Style Mount Gripper for Grooved 32mm (1.25") dia. Pin Stub Mounts, 45° angle
    Two Step, Hand Carbon Rod Shaper - Systems for Research
    Two Step, Hand Carbon Rod Shaper - Systems for Research
    Two Step, Hand Carbon Rod Shaper
    UHV-EL Retainers Without Standards - Systems for Research
    UHV-EL Retainers Without Standards - Systems for Research
    UHV-EL Retainers Without Standards
    UHV-EL Single Reference Standards (3mm dia.) for Retainers - Systems for Research
    UHV-EL Single Reference Standards (3mm dia.) for Retainers - Systems for Research
    UHV-EL Single Reference Standards (3mm dia.) for Retainers
    Ultra High Resolution Test Specimen, Gold on Carbon 3 - Systems for Research
    Ultra High Resolution Test Specimen, Gold on Carbon 3 - Systems for Research
    Ultra High Resolution Test Specimen, Gold on Carbon 3
    Ultra-Flat 4" Silicon Wafers - Systems for Research
    Ultra-Flat 4" Silicon Wafers - Systems for Research
    Ultra-Flat 4" Silicon Wafers
    Ultra-Flat 6" Silicon Wafers - Systems for Research
    Ultra-Flat 6" Silicon Wafers - Systems for Research
    Ultra-Flat 6" Silicon Wafers
    Universal Specimen Holder with Tall Storage Box - Systems for Research
    Universal Specimen Holder with Tall Storage Box - Systems for Research
    Universal Specimen Holder with Tall Storage Box
    Universal Springloaded Vise - Systems for Research
    Universal Springloaded Vise - Systems for Research
    Universal Springloaded Vise
    Universal Springloaded Vise - Systems for Research
    Universal Springloaded Vise - Systems for Research
    Universal Springloaded Vise
    Variable Size Geological Thin Section Holder - Systems for Research
    Variable Size Geological Thin Section Holder - Systems for Research
    Variable Size Geological Thin Section Holder
    Variable Tilt Specimen Holder - Systems for Research
    Variable Tilt Specimen Holder - Systems for Research
    Variable Tilt Specimen Holder
    Variable Tilt Specimen Holder for Hitachi M4 Mounts - Systems for Research
    Variable Tilt Specimen Holder for Hitachi M4 Mounts - Systems for Research
    Variable Tilt Specimen Holder for Hitachi M4 Mounts
    Variable Tilt Specimen Holder for Pin Mounts - Systems for Research
    Variable Tilt Specimen Holder for Pin Mounts - Systems for Research
    Variable Tilt Specimen Holder for Pin Mounts
    Vitreous Carbon Planchet - Systems for Research
    Vitreous Carbon Planchet - Systems for Research
    Vitreous Carbon Planchet
    Wafer Holders for Notch Style Wafers; 4 - 12" - Systems for Research
    Wafer Holders for Notch Style Wafers; 4 - 12" - Systems for Research
    Wafer Holders for Notch Style Wafers; 4 - 12"
    Wafer Holders with Pin for Notch Style Wafers; 4 and 6" - Systems for Research
    Wafer Holders with Pin for Notch Style Wafers; 4 and 6" - Systems for Research
    Wafer Holders with Pin for Notch Style Wafers; 4 and 6"
    Wafer Holders with Pin for Wafers with a Flat; 1 - 6" - Systems for Research
    Wafer Holders with Pin for Wafers with a Flat; 1 - 6" - Systems for Research
    Wafer Holders with Pin for Wafers with a Flat; 1 - 6"
    Well Mount, Aluminum - Systems for Research
    Well Mount, Aluminum - Systems for Research
    Well Mount, Aluminum
    Wider Version Large Set Screw Vise - Systems for Research
    Wider Version Large Set Screw Vise - Systems for Research
    Wider Version Large Set Screw Vise
    X-Large Bulk Specimen Holder - Systems for Research
    X-Large Bulk Specimen Holder - Systems for Research
    X-Large Bulk Specimen Holder
    X-Large Bulk Specimen Holder - Systems for Research
    X-Large Bulk Specimen Holder - Systems for Research
    X-Large Bulk Specimen Holder
    XX-Large Bulk Specimen Holder - Systems for Research
    XX-Large Bulk Specimen Holder - Systems for Research
    XX-Large Bulk Specimen Holder
    XX-Large Bulk Specimen Holder - Systems for Research
    XX-Large Bulk Specimen Holder - Systems for Research
    XX-Large Bulk Specimen Holder
    Ø18mm x 6mm pin height; Shorter pin for all ZEISS/LEO SEM, FESEM & FIB Systems - Systems for Research
    Ø18mm x 6mm pin height; Shorter pin for all ZEISS/LEO SEM, FESEM & FIB Systems - Systems for Research
    Ø18mm x 6mm pin height; Shorter pin for all ZEISS/LEO SEM, FESEM & FIB Systems
    Ø18mm x 8mm pin height - Systems for Research
    Ø18mm x 8mm pin height - Systems for Research
    Ø18mm x 8mm pin height
    Ø25.4mm x 6mm pin height; Shorter pin for all ZEISS/LEO SEM, FESEM/FIBS - Systems for Research
    Ø25.4mm x 6mm pin height; Shorter pin for all ZEISS/LEO SEM, FESEM/FIBS - Systems for Research
    Ø25.4mm x 6mm pin height; Shorter pin for all ZEISS/LEO SEM, FESEM/FIBS
    Ø32mm x 6mm pin height; shorter pin for all Zeiss/LEO SEM, FESEM & FIB systems - Systems for Research
    Ø32mm x 6mm pin height; shorter pin for all Zeiss/LEO SEM, FESEM & FIB systems - Systems for Research
    Ø32mm x 6mm pin height; shorter pin for all Zeiss/LEO SEM, FESEM & FIB systems
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