Thin Specimen Split Mount on Pin Stub

SEM Pin Mount Specimen Holders
for Scanning Electron Microscopy

A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1/8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).
Used on FEI/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs

12.7mm (1/2") dia., 3.2mm (1/8") dia. pin
pin length 8mm (.314")

For examination of thin samples from textiles, plants, paper, plastics, metals, etc., in cross section. Special wide opening up to 6.4mm (1/4"). Grooved head. Height of head is 7.4mm (0.29"). Pin is centered. Material: machined aluminum with stainless steel allen set screw. Allen wrench included.

Screw used is 2-56 x 3/8, Hex, Set, Stainless Steel
Thin Specimen Split Mount, 1/2", 8mm L pin