Tap300Al-G-10

Tap300Al-G

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Standard Tapping Mode AFM Probe

  • Standard Tapping Mode AFM Probe

    Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation.

    The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

    The AFM holder chip fits most commercial AFM systems as it is industry standard size.

    For measurements in liquids please use the back side gold coated Tap300GD-G or the overall gold coated Tap300GB-G!


  • AFM Tip

    SHAPE Rotated
    Tip Height 17µm - From 15µm To 19µm
    Tip Setback 15µm - From 10µm To 20µm
    Tip Radius < 10nm
    Half Cone Angle 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex
  • AFM Cantilever

    Shape Beam
    Force Constant 40N/m - From 20N/m To 75N/m
    Resonance Frequency 300kHz - From 200kHz To 400kHz
    Length 125µm - From 115µm To 135µm
    Width 30µm - From 25µm To 35µm
    Thickness 4µm - From 3µm To 5µm