NCHV-AW

$7,629.30

40 N/m, 320 kHz, Al Reflex Coating, Wafer (375 Probes)

DESCRIPTION
TIP SPECIFICATIONS
CANTILEVER SPECIFICATIONS

Value Line etched Silicon probes for imaging in TappingMode and non-contact mode in air.

Product Sheet

Specifications:
- 40 N/m, 320 kHz, 8 nm tip radius, Al reflex coating.
- 375 probes per wafer.
- Compatible with most commercially available AFMs.

Tip Geometry:	Standard (Steep)
Tip Height:	10 - 15
Front Angle:	25 ± 2.5
Back Angle:	15 ± 2.5
Side Angle:	22.5 ± 2.5
Tip Radius (Nom):	8
Tip Set Back (Nom):	12.5
Tip Set Back( RNG):	9 - 16
Tilt Compensation:	cell2

Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.

Cantilever Material:	0.01 - 0.025 Ωcm Antimony (n) doped Si
Cantilever Thickness (Nom):	3.5
Cantilever Thickness (RNG):	2.8 - 4.2
Cantilever Geometry:	Rectangular
Cantilevers Number:	1
Back Side Coating:	Reflective Aluminum