FMV-W

FMV-W

2.8N/m, 75kHz, No Reflective Coating, Wafer

  • A pack of Silicon Probes.
    Quantity=Wafer

    Bruker's Value Line of soft TappingMode™ and Force Modulation probes.  This probe is also available with an Aluminum reflex coating as model FMV-AW.

    Specifications:
    - 2.8N/m, 75kHz, No Reflective Coating.
    - Unmounted for use on any AFM.

  • Tip Geometry: Standard (Steep)
    Tip Height: 10 - 15
    Front Angle: 25 ± 2.5
    Back Angle: 15 ± 2.5
    Side Angle: 22.5 ± 2.5
    Tip Radius (Nom): 8
    Tip Set Back (Nom): 11.5
    Tip Set Back( RNG): 8 - 15

  • Cantilever Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
    Cantilever Thickness (Nom): 2.75
    Cantilever Thickness (RNG): 2.0 - 3.5
    Cantilever Geometry: Rectangular
    Cantilevers Number: 1