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    Web Store / Bruker Value AFM Probes / CONTV-W
    CONTV-W - Systems for Research

    CONTV-W

    CONTV-W

    $7,350.00
    0.2N/m, 13kHz, No Reflective Coating, Wafer

    • A pack of Silicon Probes.

      Quantity=Wafer

      Bruker's Value Line of Contact Mode in air ONLY probes.  This probe is also available with an Aluminum reflex coating as model CONTV-AW.

      Specifications:

      • 0.2N/m, 13kHz, No Reflective Coating.
      • Unmounted for use on any AFM.

    • Tip Geometry: Standard (Steep)
      Tip Height: 10 - 15
      Front Angle: 25 ± 2.5º
      Back Angle: 15 ± 2.5º
      Side Angle: 22.5 ± 2.5º
      Tip Radius (Nom): 8
      Tip Set Back (Nom): 15
      Tip Set Back( RNG): 5 - 25

    • Cantilever Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
      Cantilever Thickness (Nom): 2
      Cantilever Thickness (RNG): 1.5 - 2.5
      Cantilever Geometry: Rectangular
      Cantilevers Number: 1
      Back Side Coating: Reflective Aluminum