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    Web Store / Bruker AFM Probes / LTESPW-V2
    LTESPW-V2 - Systems for Research

    LTESPW-V2

    LTESPW-V2

    Price On Request - CONTACT US FOR QUOTE
    48N/m, 190kHz, 4-Sided Tip, No Coatings, Wafer

    • A wafer of High quality long-lever etched silicon probes for TappingMode™ and other non-contact modes.

      Unmounted for use on standard AFM's.

      Bruker AFM Probes has introduced an improved version of its popular, LTESP/LTESPA AFM probes. Bruker’s new line of LTESP high quality premium etched silicon probes set the industry standard for long-lever TappingMode™ and non-contact mode in air.

      The new design provides

      • Tighter dimensional specifications for improved probe to probe consistency
      • Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
      • Improved probe quality and aesthetics

      This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model LTESPAW-V2.


    • Tip Geometry: Standard (Steep)
      Tip Height: 10 - 15
      Front Angle: 25 ± 2.5
      Back Angle: 15 ± 2.5
      Side Angle: 22.5 ± 2.5
      Tip Radius (Nom): 8
      Tip Radius (Max): 12
      Tip Set Back (Nom): 15
      Tip Set Back( RNG): 5 - 25

    • Cantilever Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
      Cantilever Thickness (Nom): 6.8
      Cantilever Thickness (RNG): 5.8 - 7.8
      Cantilever Geometry: Rectangular
      Cantilevers Number: 1