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    Web Store / Bruker AFM Probes / HAR1-200-10
    HAR1-200-10 - Systems for Research

    HAR1-200-10

    HAR1-200-10

    $1,617.00
    42N/m, 320kHz, Asymmetric Tip, No Coating

    • A pack of High Aspect Ratio Probes
      Tilt-Compensated High Aspect Ratio (5:1) Focused Ion Beam (FIB) probes for high resolution TappingMode imaging on samples with tall/deep geometries.  Unmounted for all AFMs.
      Quantity=10
    • High aspect ratio probe based upon Bruker technology and made from our TESP. Aspect ratio of 5:1 at 1um from tip apex.

      Tip Geometry: High Aspect Ratio
      Tip Height: 10 - 15
      Front Angle: 5 ± 0.5
      Back Angle: 5 ± 0.5
      Side Angle: 5 ± 0.5
      Tip Radius (Nom): 10
      Tip Radius (Max): 15
      Tip Set Back (Nom): 15
      Tip Set Back( RNG): 5 - 25
      Tilt Compensation: 12

    • Cantilever Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
      Cantilever Thickness (Nom): 3.5
      Cantilever Thickness (RNG): 2.8-4.2
      Cantilever Geometry: Rectangular
      Cantilevers Number: 1