FIB6-400

FIB6-400

5-Pack, 42N/m, 320kHz, 10nm Tip Radius, 400nm-Wide-Spike @ 6µm

  • 42N/m, 320kHz, 10nm Tip Radius, 400nm-Wide-Spike @ 6µm
  • High aspect ratio probe based upon Bruker technology and made from our TESP. Aspect ratio of 15:1 at 6um from tip apex.

    Tip Geometry: High Aspect Ratio
    Tip Height: 10 - 15
    Front Angle: 1.7 ± 0.5
    Back Angle: 1.7 ± 0.5
    Side Angle: 1.7 ± 0.5
    Tip Radius (Nom): 10
    Tip Radius (Max): 15
    Tip Set Back (Nom): 15
    Tip Set Back( RNG): 5 - 25
    Tilt Compensation: 12

  • Cantilever Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
    Cantilever Thickness (Nom): 4
    Cantilever Thickness (RNG): 3.25 - 4.75
    Cantilever Geometry: Rectangular
    Cantilevers Number: 1