NM-TC

NM-TC


  • Nanomechanics Probe, 350 N/m, 750kHz, 25nm ROC, 5-Pack. Uncalibrated.These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear-resistant diamond and a broad cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes have demonstrated highly repeatable deep (~100nm) indentations into materials such as fused silica and can image the indents at high resolution in-situ using the same probe. Each probe comes with a high-resolution SEM image showing the precise tip shape. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam.For fully quantitative measurements, consider the calibrated model NM-RC-C.Nanomechanical modes: Tomography, nanoscratching, and nanoindentation, and their combination with PeakForce QNM, FASTForce Volume, or contact resonance.

  • Tip Geometry: Cone
    Tip Height: 12.5 +/- 2.5
    Front Angle: 25 +/- 5
    Back Angle: 15 +/- 5
    Side Angle: 22.5 +/- 5
    Tip Radius (Nom): 25
    Tip Radius (Max): 35
    Tilt Compensation: 0 +/- 1

  • Cantilever Material: Diamond
    Cantilever Thickness (Nom): 4