NCHV-W

NCHV-W

40N/m, 320kHz, No Reflective Coating, Wafer (375 Probes)

  • A pack of Silicon Probes.
    Quantity=Wafer

    Bruker's Value Line etched silicon probes for imaging in TappingMode™ and non-contact mode in air.  This probe is also available with Aluminum reflex coating as model NCHV-AW.

    Specifications:
    - 40N/m, 320kHz, No Reflective Coating.
    - Unmounted for use on any AFM.

  • Tip Geometry: Standard (Steep)
    Tip Height: 10 - 15
    Front Angle: 25 ± 2.5
    Back Angle: 15 ± 2.5
    Side Angle: 22.5 ± 2.5
    Tip Radius (Nom): 8
    Tip Set Back (Nom): 12.5
    Tip Set Back( RNG): 9 - 16

  • Cantilever Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
    Cantilever Thickness (Nom): 3.5
    Cantilever Thickness (RNG): 2.8 - 4.2
    Cantilever Geometry: Rectangular
    Cantilevers Number: 1