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    NCHV-AW - Systems for Research

    NCHV-AW

    NCHV-AW

    $7,738.29
    40 N/m, 320 kHz, Al Reflex Coating, Wafer (375 Probes)

    • Value Line etched Silicon probes for imaging in TappingMode and non-contact mode in air. 

       Product Sheet

      Specifications:
      - 40 N/m, 320 kHz, 8 nm tip radius, Al reflex coating.
      - 375 probes per wafer.
      - Compatible with most commercially available AFMs.

    • Tip Geometry: Standard (Steep)
      Tip Height: 10 - 15
      Front Angle: 25 ± 2.5
      Back Angle: 15 ± 2.5
      Side Angle: 22.5 ± 2.5
      Tip Radius (Nom): 8
      Tip Set Back (Nom): 12.5
      Tip Set Back( RNG): 9 - 16
      Tilt Compensation: cell2
    • Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.

      Cantilever Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
      Cantilever Thickness (Nom): 3.5
      Cantilever Thickness (RNG): 2.8 - 4.2
      Cantilever Geometry: Rectangular
      Cantilevers Number: 1
      Back Side Coating: Reflective Aluminum