MSS-FESPA

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2.8 N/M k, 30nm diameter, 400 nm length, 2-PK.

DESCRIPTION
TIP SPECIFICATIONS
CANTILEVER SPECIFICATIONS

Due to the softer FESPA cantilever this multipurpose high resolution probe approaches ultimate lifetime and reliability. The special qualities of our MSS-FESPA also lead to the best interaction between tip and cantilever.
Designed for non-contact / high frequency mode, it delivers outstanding resolution in critical AFM applications even on hard, tip eating samples like ceramics, silicon oxide/nitride or polysilicon.
Tip Geometry: Super sharp

Tip Radius (Nom): 2 - 3

Tip Set Back (Nom): 1 - 14

Tip Set Back( RNG): 5 - 25

Tilt Compensation: 3

Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.

Cantilever Material:	0.01 - 0.025Ωcm Antimony (n) doped Si
Cantilever Thickness (Nom):	3
Cantilever Thickness (RNG):	2 - 4
Cantilever Geometry:	Rectangular
Cantilevers Number:	11 - 31
Back Side Coating:	Reflective Aluminum

Tip Geometry:	Super sharp
Tip Radius (Nom):	2 - 3
Tip Set Back (Nom):	1 - 14
Tip Set Back( RNG):	5 - 25
Tilt Compensation:	3