MESP-LM-V2
Bruker's new MESP-LM-V2 probe replaces the legacy MESP-LM probe.
Bruker's MESP-LM-V2 is the established choice for Magnetic Force Microscopy. Built on the high-performance RFESP-75 AFM probe, the hard Cobalt-Chromium coating on this tip is tailored for high-sensitivity and magnetic contrast. This cost-effective probe has a nominal tip radius of 25 nm for excellent lateral resolution for MFM, as well as other electrical and capacitance applications requiring a cantilever with conductive coating.
The MESP-LM-V2 has a nominal coercivity of <400 Oe (medium/low), and a magnetic moment of 0.3e-13 EMU (low).
The reflex side of the cantilever has a Co-Cr coating for increased reflectivity up to 2.5 times that of an uncoated probe.
The new design provides:Tip Geometry: | Rotated |
Tip Height: | 10 - 15 |
Front Angle: | 17.5 ± 2.5 |
Back Angle: | 25 ± 2.5 |
Side Angle: | 20 ± 2.5 |
Tip Radius (Nom): | 25 |
Tip Radius (Max): | 35 |
Tip Coating: | Magnetic |
Tip Set Back (Nom): | 9.5 |
Tip Set Back( RNG): | 7 - 12 |
Cantilever Material: | 0.01 - 0.025 Ωcm Antimony (n) doped Si |
Cantilever Thickness (Nom): | 2.8 |
Cantilever Thickness (RNG): | 2.05 - 3.55 |
Cantilever Geometry: | Rectangular |
Cantilevers Number: | 1 |
Front Side Coating: | Magnetic CoCr |
Back Side Coating: | Reflective CoCr |