MESP-LCW

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2.8N/m, 75kHz, <10Oe, <1e-13EMU

DESCRIPTION
TIP SPECIFICATIONS
CANTILEVER SPECIFICATIONS

Discontinued.
A wafer of Magnetic Probes
Low coercivity MFM Probes with a conductive coating that can often be an excellent and cost-effective solution for electrical and capacitance microscopy. Unmounted for all AFMs.
Quantity=380
*Due to the inherent danger of mishandling or contamination during extraction of probes by non-Veeco personnel, we do not guarantee performance of wafers once opened at the consumers site. Instead, we highly recommend buying in larger quantities of 10-packs to guarantee performance, taking advantage of bulk discount pricing.

Coercivity: < 10 Oe. (Low) Moment: < 1e-13 EMU (Medium/Low) Use this probe as an alternative for imaging magnetic samples with very strong stray fields (e.g. NdFeB permanent magnets), and to highlight grain boundaries. For a sample pack of -HM, -LM, and -LC see part MESPSP.

Tip Geometry:	Standard (Steep)
Tip Height:	10 - 15
Front Angle:	25 ± 2.5
Back Angle:	15 ± 2.5
Side Angle:	22.5 ± 2.5
Tip Radius (Nom):	35
Tip Radius (Max):	50
Tip Coating:	Magnetic
Tip Set Back (Nom):	15
Tip Set Back( RNG):	5 - 25

Cantilever Material:	0.01 - 0.025 Ωcm Antimony (n) doped Si
Cantilever Thickness (Nom):	2.75
Cantilever Thickness (RNG):	2.0 - 3.5
Cantilever Geometry:	Rectangular
Cantilevers Number:	1
Front Side Coating:	Magnetic Fe
Back Side Coating:	Reflective Fe