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    Web Store / Products / HAR1-200A-10
    HAR1-200A-10 - Systems for Research

    HAR1-200A-10

    HAR1-200A-10

    $1,789.20
    42N/m, 320kHz, Asymmetric Tip, Al Reflex Coating, 10-Pack

    • Tilt-Compensated High Aspect Ratio (5:1) Focused Ion Beam (FIB) probes for high resolution TappingMode imaging on samples with tall/deep geometries.

      Specifications:
      - 42 N/m, 320 kHz, 10 nm radius, Al reflex coating.
      - 10 probes per pack.
      - Compatible with most commercially available AFMs.
    • High aspect ratio probe based upon Bruker technology and made from our TESP. Aspect ratio of 5:1 at 1um from tip apex.

      Tip Geometry: High Aspect Ratio
      Tip Height: 10 - 15
      Front Angle: 5 ± 0.5
      Back Angle: 5 ± 0.5
      Side Angle: 5 ± 0.5
      Tip Radius (Nom): 10
      Tip Radius (Max): 15
      Tip Set Back (Nom): 15
      Tip Set Back( RNG): 5 - 25
      Tilt Compensation: 12

    • Cantilever Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
      Cantilever Thickness (Nom): 4
      Cantilever Thickness (RNG): 3.5 - 4.5
      Cantilever Geometry: Rectangular
      Cantilevers Number: 1
      Back Side Coating: Reflective Aluminum