FMV-AW

FMV-AW


  • A pack of Silicon Probes.

    Quantity=Wafer

    Bruker's Value Line of soft TappingMode™ and Force Modulation probes, with reflective coating.  This probe is also available without Aluminum reflex coating as model FMV-W.

    Specifications:

    • 2.8N/m, 75kHz, Al Reflective Coating.
    • Unmounted for use on any AFM.

  • Tip Geometry: Standard (Steep)
    Tip Height: 10 - 15
    Front Angle: 25 ± 2.5º
    Back Angle: 15 ± 2.5º
    Side Angle: 22.5 ± 2.5º
    Tip Radius (Nom): 8
    Tip Set Back (Nom): 11.5
    Tip Set Back( RNG): 8 - 15
  • The Aluminum reflective coating on the back of the cantilever increases the laser signal by 2.5 times. For general imaging, it is typically not necessary to have a reflective coating. Reflective coatings are recommended for thin cantilevers, very reflective samples, and machine vision applications.

    Cantilever Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
    Cantilever Thickness (Nom): 2.75
    Cantilever Thickness (RNG): 2.0 - 3.5
    Cantilever Geometry: Rectangular
    Cantilevers Number: 1
    Back Side Coating: Reflective Aluminum