FM-LC
High wear resistant diamond cone probe with high probe-to-probe consistency in tip shape and a tip-radius of 20nm. Ideally suited to long lifetime imaging on low relief samples at moderately high resolution. Conductive with a contact resistance in the 100kOhm range. Intermediate spring constant of 8N/m. For even higher resolution consider the AD series of diamond probes.
Applications include
| Tip Geometry: | Standard |
| Tip Height: | 12.5 +/- 2.5 |
| Front Angle: | 25+/-5 |
| Back Angle: | 15+/-5 |
| Side Angle: | 22.5+/-5 |
| Tip Radius (Nom): | 20 |
| Tip Coating: | Highly conductive single cystal diamond |
| Tip Set Back (Nom): | 15-25 |
| Tilt Compensation: | 0 +/- 1 |
| Cantilever Material: | Diamond cone probe, 8N/m |
| Cantilever Thickness (Nom): | 3 |
| Cantilever Thickness (RNG): | 2.5-3.5 |
| Cantilever Geometry: | Rectangular |
| Cantilevers Number: | 1 |
| Back Side Coating: | Reflective Au |