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    Web Store / Products / FIB4-200
    FIB4-200 - Systems for Research

    FIB4-200

    FIB4-200

    $1,491.00
    42N/m, 320kHz, 10nm Tip Radius, 200nm-Wide-Spike @ 4µm

    • 42N/m, 320kHz, 10nm Tip Radius, 200nm-Wide-Spike @ 4µm
    • High aspect ratio probe based upon Bruker technology and made from our TESP. Aspect ratio of 20:1 at 4um from tip apex.
      Tip Geometry: High Aspect Ratio
      Tip Height: 10 - 15
      Front Angle: 1.2 ± 0.5
      Back Angle: 1.2 ± 0.5
      Side Angle: 1.2 ± 0.5
      Tip Radius (Nom): 10
      Tip Radius (Max): 15
      Tip Set Back (Nom): 15
      Tip Set Back( RNG): 5 - 25
      Tilt Compensation: 12

    • Cantilever Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
      Cantilever Thickness (Nom): 4
      Cantilever Thickness (RNG): 3.25 - 4.75
      Cantilever Geometry: Rectangular
      Cantilevers Number: 1