DDESP-FM-V2
Bruker DDESP-FM-V2 Electrical Probes
Providing consistent performance and high sensitivity.
Bruker's new conductive diamond coated probe provides high performance Scanning Spreading Resistance Microscopy (SSRM)and Piezoresponse Force Microscopy (PFM) to characterize advanced semiconductor devices, Microelectromechanical Systems (MEMS), and biosensors providing the prolonged tip lifetime in combination with boosted conductivity.
The DDESP-FM-V2 probe provides:
Other applications of the DDESP-FM-V2 probe include: Scanning Capacitance Microscopy (SCM), conductivity measurements (C-AFMand PeakForce TUNA), and other electrical characterization applications.
Tip Geometry: | Standard (Steep) |
Tip Height: | 10 - 15 |
Front Angle: | 25 ± 2.5 |
Back Angle: | 17.5 ± 2.5 |
Side Angle: | 20 ± 2.5 |
Tip Radius (Nom): | 100 |
Tip Radius (Max): | 150 |
Tip Coating: | Conductive Diamond |
Tip Set Back (Nom): | 14 |
Tip Set Back( RNG): | 11 - 16 |
Cantilever Material: | 0.010-0.025 Ωcm Antimony (n) doped Si |
Cantilever Thickness (Nom): | 2.95 |
Cantilever Thickness (RNG): | 2.20 - 3.70 |
Cantilever Geometry: | Rectangular |
Cantilevers Number: | 1 |
Front Side Coating: | Conductive Diamond |
Back Side Coating: | Reflective Aluminum |