CONTV-AW

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0.2N/m, 13kHz, Al Reflective Coating, Wafer

DESCRIPTION
TIP SPECIFICATIONS
CANTILEVER SPECIFICATIONS

A pack of Silicon Probes.
Quantity=Wafer

Bruker's Value Line of Contact Mode in air ONLY probes, with reflective coating. This probe is also available without Aluminum reflex coating as model CONTV-W.

Specifications:
- 0.2N/m, 13kHz, Al Reflective Coating.
- Unmounted for use on any AFM.

Tip Geometry:	Standard (Steep)
Tip Height:	10 - 15
Front Angle:	25 ± 2.5
Back Angle:	15 ± 2.5
Side Angle:	22.5 ± 2.5
Tip Radius (Nom):	8
Tip Set Back (Nom):	15
Tip Set Back( RNG):	5 - 25

The Aluminum reflective coating on the back of the cantilever increases the laser signal by 2.5 times. For general imaging, it is typically not necessary to have a reflective coating. Reflective coatings are recommended for thin cantilevers, very reflective samples, and machine vision applications.

Cantilever Material:	0.01 - 0.025 Ωcm Antimony (n) doped Si
Cantilever Thickness (Nom):	2
Cantilever Thickness (RNG):	1.5 - 2.5
Cantilever Geometry:	Rectangular
Cantilevers Number:	1
Back Side Coating:	Reflective Aluminum