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    Web Store / Products / All-In-One-DD
    All-In-One-DD - Systems for Research
    All-In-One-DD - Systems for Research
    All-In-One-DD - Systems for Research
    All-In-One-DD - Systems for Research
    All-In-One-DD - Systems for Research
    All-In-One-DD - Systems for Research
    All-In-One-DD - Systems for Research
    All-In-One-DD - Systems for Research

    AIO-DD-5

    All-In-One-DD

    $1,119.40
    Select Quantity
    Diamond Coated, Conductive AFM Probe with 4 Different Cantilevers

    • Diamond Coated, Conductive AFM Probe with 4 Different Cantilevers

      Versatile monolithic silicon AFM probe with 4 different cantilevers on a single AFM holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping / non-contact mode and electric modes such as: scanning capacitance microscopy (SCM), electrostatic force microscopy (EFM), Kelvin probe force microscopy (KFM), scanning probe lithography and conductive atomic force microscopy (C-AFM).

      The doped polycristalling diamond tip coating provides unprecedented hardness and durability, as well as electridcal conductivity for demanding electrical applications. The resulting tip radius is in the range 100-300nm.

      The rotated tips allow for more symmetric representation of high sample features.

      The AFM holder chip fits most commercial AFM systems as it is industry standard size.

      The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose the right cantilever for each application in the very last moment. You do not need to stock various AFM probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the All-In-One cantilevers differs from the geometry of the comparable specialized single-cantilever AFM probes.

      Please note that the aluminum back side coating is not suitable for measurements in liquids!


    • AFM Tip

      SHAPE Rotated
      Tip Height 17µm
      From 15µm To 19µm
      Tip Setback 15µm
      From 10µm To 20µm
      Half Cone Angle 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex
    • Cantilever A - Contact Mode Cantilever B - Force Modulation
      Shape Beam Shape Beam
      Force Constant 0.5N/m - From 0.2N/m To 0.9N/m Force Constant 6.5N/m - From 3N/m To 12N/m
      Resonance Frequency 19kHz - From 16kHz To 24kHz Resonance Frequency 110 - From 80kHz To 140kHz
      Length 500µm - From 490µm To 510µm Length 210µm - From 200µm To 220µm
      Width 30µm - From 25µm To 35µm Width 30µm - From 25µm To 35µm
      Thickness 2.7µm - From 1.7µm To 3.7µm Thickness 2.7µm - From 1.7µm To 3.7µm
      Cantilever C - Soft Tapping Cantilever D - Tapping Mode
      Shape Beam Shape Beam
      Force Constant 18N/m - From 8N/m To 35N/m Force Constant 100N/m - From 48N/m To 190N/m
      Resonance Frequency 200kHz - From 140kHz To 260kHz Resonance Frequency 450kHz - From 230kHz To 600kHz
      Length 150µm - From 140µm To 160µm Length 100µm - From 90µm To 110µm
      Width 30µm - From 25µm To 35µm Width 50µm - From 45µm To 55µm
      Thickness 2.7µm - From 1.7µm To 3.7µm Thickness 2.7µm - From 1.7µm To 3.7µm